6SIGMA 缩写解释列表[教学]

a Alpha, risk of rejecting the null hypothesis erroneously
AFR Average failure rate
ANOM Analysis of means
ANOVA Analysis of variance
AQL Acceptable quality level
ARL Average run length
b Beta, risk of not rejecting the null hypothesis erroneously
c chart Control chart for nonconformities
C&E Cause and effect (diagram)
CL Center line in an SPC chart
CDF Cumulative distribution function
Cp Capability index which shows the process capability potential but does not consider how centered the process is.
Cpk Capability index used to compare the natural tolerance of a process within the specification limits. Cpk has a value equal to Cp if the process is centered on the nominal; if Cpk is negative, the process mean is outside of the specification limits; if Cpk is between 0 and 1 then the natural tolerances of the process falls outside the spec limits.
COPQ Cost of poor quality
CTC Critical to cost
CTD Critical to delivery
CTP Critical to process
CTQ Critical to quality
CUSUM Control chart which plots the cumulative deviation of each subgroup’s average from the nominal value.
D chart Demerit chart
DF Degrees of freedom
DOE Design of experiments
DPM Defects per million
DPMO Defects per million opportunities
FMEA Failure mode and effects analysis
Gage R&R Gage repeatability and reproducibility
Ho Null hypothesis
Ha Alternative hypothesis
KCA Knowledge centered activity
KPIV Key process input variables
KPOV Key process output variables
LCL Lower control limit (in SPC)
m Mu, population true mean
Estimate of population mean
MCT WIP/EXIT
MCE Value Added Time/Manufacturing Cycle Time
MS Mean square
MSA Measurement Systems Analysis
MTBF Mean time between failures
n Sample size
np (chart) SPC chart of number of nonconforming items
NGT Nominal group technique
P probability
p (chart) Control chart of the proportion of defective units (or fraction defective) in a subgroup. Based on the binomial distribution
PCE Value Added Time/Process Cycle Time
PCT Process Cycle Time, the time for single or one batch unit through the process
P Value The probability of making a Type I error.
PDF Probability density function
ppm Parts per million (defect rate)
Pp Performance index (AIAG l995b) (calculated using "longterm" standard deviation)
Ppk Performance index (AIAG 1995b) (calculated using "longterm" standard deviation)
P/T Precision to tolerance ratio
QFD Quality function deployment
R Range (in SPC)
RSM Response surface methodology
RTY Rolled Throughput Yield
r Number of failures, correlation coefficient
R2 Coefficient of determination
r(t) System failure rate at time (t) for the NHPP model
s Sigma, population standard deviation
Estimate for population standard deviation
s Standard deviation of a sample
S Chart Sample standard deviation chart
SPC Statistical process control
SS Sum of squares
UCL Upper control limit (SPC)
u (chart) SPC chart of number of nonconformities per unit
Mean of a variable x
Median of variable x
chart SPC chart of means (i.e., xbar chart)
Xmr (chart) SPC chart of individual and moving range measurements
Z - Value (Xi - X-Bar)/ s