求翻译成中文，谢谢~很急~
it was found out that a discrepancy on ATE handler setting and prober setting
caused an offset on wafer map retest result wherein site1 was tested but site2
bin outcome was updated and reflected on the final wafer map.
谢谢~
caused an offset on wafer map retest result wherein site1 was tested but site2
bin outcome was updated and reflected on the final wafer map.
谢谢~
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BOBObaby (威望:1) (广东 深圳) 家电或电器 其它 - 资深菜鸟
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发现，是ATE handler和proper的设置上的差异导致了晶片图复测结果产生偏移。测试Site1处却使得site2 bin的结果产生了变化并影响到了最终的晶片图……